Coming Soon

DFT

Design for Testability services — scan insertion, ATPG, MBIST, boundary scan, and DFT rule analysis for thorough manufacturing test coverage. Ensuring silicon is fully testable from first silicon through production volume.

Planned Offerings

What's Coming

DFT is a Phase 2 service launching soon. The capabilities below cover the full DFT flow — from scan architecture through ATPG, MBIST, and boundary scan.

Scan Design

Scan architecture planning
Scan chain integration
Scan enable and test mode logic review
Scan connectivity verification
Scan compression coordination

DFT Rule Analysis

DFT rule check review
Testability issue identification
Controllability and observability analysis
Violation debug and resolution
DFT readiness assessment

ATPG

ATPG pattern generation coordination
Stuck-at fault support
Transition fault support
Fault model analysis
Pattern validation coordination

Memory Test

MBIST integration
Memory repair flow coordination
Memory test logic verification
SRAM test strategy review
BIST controller integration

Built-In Self-Test

LBIST enablement
BIST architecture coordination
Test mode verification
Logic test planning
Pattern application review

Boundary Scan and JTAG

JTAG architecture definition
Boundary scan integration
TAP controller verification
Pin-level test access planning
Manufacturing test interface review

DFT